The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 08, 2017
Bmc Software, Inc., Houston, TX (US);
Douglas Mueller, Palo Alto, CA (US);
Jiani Chen, San Jose, CA (US);
BMC Software, Inc., Houston, TX (US);
Abstract
Overlay datasets provide an efficient, flexible and scalable mechanism to represent the logical replication of one or more prior defined datasets. Only changes made to an entity in an overlay dataset's underlying dataset are replicated into the overlay dataset (such changes do not affect the underlying dataset). Read operations directed to the overlay dataset will find entities in the overlay dataset if they exist and in the underlying dataset(s) if no overlay-specific entity exists. Accordingly, overlay datasets provide an efficient mechanism for making changes to an existing dataset without suffering the high processing time and storage overhead associated with prior art copying and versioning techniques. Overlay datasets also provide a natural mechanism to keep two or more datasets in synchronization because changes to a base or underlying dataset's entities are 'visible' in its associated overlay dataset (unless the entity has been modified in the overlay dataset).