The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Apr. 06, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gary Denner, Longwood, IE;

Paul Kilroy, Dublin, IE;

Michael J. Loughran, Dublin, IE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/25 (2019.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/212 (2019.01); G06F 16/254 (2019.01);
Abstract

This invention relates to a system, method and computer program product for a data warehouse model validation system, said data warehouse model validation system having an ETL model and a corresponding data warehouse model, said data ETL system comprising: an element group locator for locating an element group across the ETL model and the data warehouse model, whereby the element group comprises ETL elements and related data warehouse elements; an inconsistency determiner for determining inconsistencies between the ETL elements and data warehouse elements, whereby one or more elements are missing from the data warehouse model or one or more elements in the data warehouse model do not correspond to expected elements or features of elements; and an inconsistency recorder for recording any located missing elements or unexpected elements from the located element group.


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