The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10585747 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 10, 2020

Filed:

Aug. 22, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

David A. Pierce, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0635 (2013.01); G06F 3/0673 (2013.01); G06F 11/1076 (2013.01); G06F 2211/104 (2013.01);
Abstract

In one embodiment, a system includes logic configured to receive data comprising a plurality of data elements, where each data element comprises one or more bits. Further, the logic is configured to output bursts of data comprising the plurality of data elements along with a number of parity bits equal to a number of data elements in the plurality of data elements received from a first parity module to an input of a data path. Further still, the system includes a binary sequence generator configured to create a binary sequence comprising a plurality of bonus bits in a pseudo-random pattern that has less than a predetermined chance of matching any sequence of bits in the data while in the data path. Further still, the first parity module is configured to provide a parity calculation prior to passing the plurality of data elements to the input of the data path.


Find Patent Forward Citations

Pierce, David. (2020). Detecting single event upsets and stuck-at faults in ram-based data path controllers (U.S. Patent No. 10585747). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10585747

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