The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Nov. 08, 2018
International Business Machines Corporation, Armonk, NY (US);
Hernan A. Cunico, Holly Springs, NC (US);
Jonathan Dunne, Dungarvan, IE;
Jeremiah O'Connor, Roscommon, IE;
Asima Silva, Holden, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for performing a root cause analysis. A CPU identifies events of interest as a function of a user's observable behavior, which includes the user's eye gaze, while viewing event data. The CPU calculates an interest score for each of the identified events of interest, wherein the interest score is a probability of each of the identified events of interest being a root cause of a defect. The CPU tags each of the events of interest with a tag as a function of each calculated interest score. The identifying of the one or more events of interest includes: correlating a focal point of the user's eye gaze to a viewing position of a display device displaying the file; and identifying, as a function of the viewing position, the event data being viewed and an amount of time that the event data is viewed by the user.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile