The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

May. 25, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/20 (2006.01); G06F 11/30 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06F 11/2069 (2013.01); G06F 11/3034 (2013.01); H04L 41/069 (2013.01); H04L 41/0622 (2013.01); H05K 999/99 (2013.01);
Abstract

A method and technique for data lifecycle management includes identifying a fault from a monitored system. A time period window associated with the fault is defined based on when the fault occurred. One or more metrics that are related to the fault and that fall within the time period window are identified and stored in a memory. A lifespan condition associated with the fault is identified, and varying levels of lifespans are assigned to the one or more metrics based on a level of relationship between the respective one or more metrics. The one or more metrics are removed from the memory if their associated lifespans are over.


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