The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Apr. 09, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Satoshi Ikai, Yamanashi, JP;

Shoutarou Hashimoto, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4067 (2006.01); G06T 7/13 (2017.01); G05B 19/402 (2006.01); G05B 19/408 (2006.01); G06T 1/60 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4067 (2013.01); G05B 19/402 (2013.01); G05B 19/4086 (2013.01); G06T 1/60 (2013.01); G06T 7/13 (2017.01); G05B 2219/35514 (2013.01); G05B 2219/37435 (2013.01);
Abstract

A control system of a machine tool includes an analysis device, the analysis device includes acquisition portions which acquire chronological control data when a work is machined and which acquire spatial machined surface measurement data after the machining of the work, a storage portion which stores the control data and the machined surface measurement data, a data-associating processing portion which associates the control data and the machined surface measurement data with each other in two machining directions, a machined surface failure detection portion which detects a failure on the machined surface of the work and a location thereof based on the machined surface measurement data in the two machining directions and an identification portion which identifies a drive axis that causes the failure from the detected failure and the machining direction of the control data corresponding to the detected failure location.


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