The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 12, 2017
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventors:
Masaya Okada, Kobe, JP;
Shigeki Iwanaga, Kobe, JP;
Assignee:
Sysmex Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/28 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/368 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/28 (2013.01); H04N 5/2256 (2013.01); H04N 5/23293 (2013.01); G02B 21/26 (2013.01);
Abstract
Disclosed is a microscope device that includes: a sample placement unit on which a sample is set; an imaging unit configured to take an image of the sample that is set on the sample placement unit; a case in which the sample placement unit is provided and the imaging unit is disposed; a display unit configured to display the image taken by the imaging unit; and a moving unit, provided integrally with the display unit, configured to be movable relative to the sample placement unit.