The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 28, 2018
Leica Biosystems Imaging, Inc., Vista, CA (US);
Leng-Chun Chen, Vista, CA (US);
Yunlu Zou, San Diego, CA (US);
Allen Olson, San Diego, CA (US);
Peyman Najmabadi, San Diego, CA (US);
Greg Crandall, San Marcos, CA (US);
Nicholas Newberg, San Marcos, CA (US);
Aaron Stearrett, Port Orchard, WA (US);
LEICA BIOSYSTEMS IMAGING, INC., Vista, CA (US);
Abstract
Two-pass capture of a macro image. In an embodiment, a scanning apparatus comprises a stage, a high-resolution camera, and a lens that provides a field of view, substantially equal in width to a slide width, to the high-resolution camera. The apparatus also comprises a first illumination system for transmission-mode illumination, and a second illumination system for reflection-mode illumination. Processor(s) move the stage in a first direction to capture a first macro image of a specimen during a single pass while the field of view is illuminated by the first illumination system, and move the stage in a second direction to capture a second macro image of the specimen during a single pass while the field of view is illuminated by the second illumination system. The processor(s) identify artifacts in the second macro image, and, based on those artifacts, correct the first macro image to generate a modified first macro image.