The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 05, 2018
Rapiscan Systems, Inc., Torrance, CA (US);
Joseph Bendahan, San Jose, CA (US);
Rapiscan Systems, Inc., Torrance, CA (US);
Abstract
An X-ray inspection system for scanning objects is provided. The system includes a stationary X-ray source made of one or more linear modules positioned around a scanning volume, and defining sparsely positioned multiple stationary X-ray source points from which X-rays can be directed through the scanning volume. An X-ray detector array extends around the scanning volume and is arranged to detect X-rays from the source points which have passed through the scanning volume. A conveyor is arranged to convey the objects through the scanning volume and at least one processor processes the detected X-rays to produce three dimensional images of the items.