The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Feb. 12, 2016
Applicant:

Vista Clara Inc., Mukilteo, WA (US);

Inventors:

Elliot D. Grunewald, Seattle, WA (US);

David O. Walsh, Mukilteo, WA (US);

Assignee:

VISTA CLARA INC., Mukilteo, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/14 (2006.01); G01N 24/08 (2006.01); G01R 33/44 (2006.01); G01R 33/341 (2006.01);
U.S. Cl.
CPC ...
G01V 3/14 (2013.01); G01N 24/081 (2013.01); G01R 33/448 (2013.01); G01R 33/341 (2013.01); G01R 33/445 (2013.01);
Abstract

Technologies including NMR relaxation time estimation methods and corresponding apparatus are disclosed. Example techniques may include performing at least one single-pulse acquisition sequence, the single-pulse acquisition sequence comprising transmitting a single modulated pulse with a surface coil, wherein the phase, frequency, or amplitude of the single modulated pulse is varied during the single modulated pulse, and wherein the single modulated pulse excites a transverse magnetization component within a subsurface fluid. The resulting NMR signal may be recorded on at least one receiving device, including recording the NMR signal associated with the transverse magnetization component excited by the single modulated pulse. Processing techniques may be applied in which recorded NMR response data are used to estimate NMR properties and the relaxation times Tand T* as a function of position as well as one-dimensional and two-dimension distributions of Tversus T* as a function of subsurface position.


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