The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Feb. 09, 2018
Applicant:

Mojix, Inc., Los Angeles, CA (US);

Inventors:

Ramin Sadr, Los Angeles, CA (US);

Scott Stephens, Los Angeles, CA (US);

Christopher Richard Jones, Pacific Palisades, CA (US);

Assignee:

Mojix, Inc., Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2010.01); G01S 5/12 (2006.01); G06K 7/10 (2006.01); G01S 3/74 (2006.01); G01S 5/04 (2006.01); G01S 13/87 (2006.01);
U.S. Cl.
CPC ...
G01S 5/02 (2013.01); G01S 5/0278 (2013.01); G01S 5/12 (2013.01); G06K 7/10366 (2013.01); G01S 3/74 (2013.01); G01S 5/04 (2013.01); G01S 13/878 (2013.01);
Abstract

Systems and methods for locating one or more radio frequency identification (RFID) tags are provided. A phase difference of received information signals of illuminated RFID tags is utilized to locate the RFID tags. One or more exciters transmit interrogation signals to illuminate the RFID tags in which the exciters may have a plurality of antenna selectively configured to transmit through two or more antennas and to receive on one antenna. Multiple reads of the same RFID tag can also be performed to generate a probability model of the location of the RFID tag. An enhanced particle filter is applied to probability model to determine the exact location of the RFID.


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