The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Jan. 17, 2017
Applicant:

Ohio State Innovation Foundation, Columbus, OH (US);

Inventors:

Stephen C. Lee, Dublin, OH (US);

Wu Lu, Dublin, OH (US);

Leonard J. Brillson, New Albany, OH (US);

Gregg A. Hadley, Albany, OH (US);

Ronald P. Pelletier, Columbus, OH (US);

Paul R. Berger, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/414 (2006.01); G01N 33/543 (2006.01); A61B 5/1473 (2006.01); A61B 5/1486 (2006.01); A61B 5/00 (2006.01); B01L 3/00 (2006.01); G01N 33/68 (2006.01); H01L 29/20 (2006.01); H01L 29/205 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5438 (2013.01); A61B 5/14735 (2013.01); A61B 5/14865 (2013.01); A61B 5/4851 (2013.01); B01L 3/502 (2013.01); B01L 3/5085 (2013.01); G01N 27/414 (2013.01); G01N 27/4145 (2013.01); G01N 33/6863 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); A61B 5/14507 (2013.01); A61B 5/14546 (2013.01); A61B 5/413 (2013.01); A61B 5/6848 (2013.01); A61B 2562/028 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/12 (2013.01); G01N 2333/521 (2013.01); G01N 2800/245 (2013.01); Y10T 436/14 (2015.01); Y10T 436/143333 (2015.01);
Abstract

Disclosed are field effect transistor-based (FET-based) sensors for the rapid and accurate detection of analytes both in vivo and in vitro. The FET-based sensors can include a substrate, a channel disposed on the substrate, a source electrode and a drain electrode electrically connected to the channel, and a recognition element for an analyte of interest immobilized on the surface of the channel via a linking group. The distance between the recognition element and the channel can be configured such that association of the analyte of interest with the recognition element induces a change in the electrical properties of the channel. In this way, an analyte of interest can be detected by measuring a change in an electrical property of the channel. Also provided are devices, including probes and multi-well plates, incorporating the FET-based sensors.


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