The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
May. 24, 2017
Applicant:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Inventors:
Jonathan J. O'Hare, East Greenwich, RI (US);
Zhanyu Ge, North Kingstown, RI (US);
Assignee:
Hexagon Metrology, Inc., North Kingstown, RI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/046 (2018.01); G01B 3/30 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01B 3/30 (2013.01); G01B 21/042 (2013.01); G01N 2223/303 (2013.01);
Abstract
A method of making a gauge for verifying or calibrating an x-ray computed tomography device positions a first plurality of objects on a first substrate, and a second plurality of objects on a second substrate. The method also certifies the positions of both the first plurality of objects on the first substrate, and the second plurality of objects on the second substrate. After certifying both the first and second plurality of objects, the method couples the first substrate with the second substrate.