The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Dec. 20, 2018
Sick Engineering Gmbh, Ottendorf-Okrilla, DE;
Alexander Schladitz, Ottendorf-Okrilla, DE;
Kai Klinder, Ottendorf-Okrilla, DE;
SICK ENGINEERING GMBH, Ottendorf-Okrilla, DE;
Abstract
An optical analysis device for determining particulate matter includes three light sources having different wavelengths, an apparatus for combining the three transmitted light beams on a common optical path, a measurement volume, an optical axis in the forward scattering direction defines the scattering angle 0°, a light absorption apparatus at 0° that absorbs unscattered light, and six detectors which are arranged at different specified angles which are as close as possible to 0° directly next to the light absorption apparatus, at a second scattering angle between 7° and 40°, at a third scattering angle between 41° and 70°, at a fourth scattering angle between 71° and 115°, at a fifth scattering angle between 116° and 145°, at a sixth scattering angle between 146° and 180°. A control and evaluation unit controls the light sources such that the scattered light is detected in a wavelength selective manner by the detectors.