The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Aug. 29, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Satoshi Hara, Tokyo, JP;

Tetsuro Morimura, Tokyo, JP;

Toshihiro Takahashi, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G05B 23/0208 (2013.01); G05B 23/0221 (2013.01); G05B 23/0235 (2013.01); B60W 2400/00 (2013.01);
Abstract

Embodiments of the present invention specify a group of sensors detecting normal operation and a group of sensors detecting abnormal operation from time-series data on the sensors without using threshold values that are based on the experience of users. One aspect of an embodiment is a detecting device for detecting changes in the output of a plurality of sensors, in which the detecting device includes: a first output acquiring unit for acquiring a first relevance matrix; a second output acquiring unit for acquiring a second relevance matrix; a change calculating unit for calculating a change matrix representing the degree of change between the first relevance matrix and the second relevance matrix; and a specifying unit for specifying a group of sensors showing a degree of change greater than the others in the change matrix. Other aspects of the present invention include a detecting method and a program.


Find Patent Forward Citations

Loading…