The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
May. 20, 2015
Nec Corporation, Tokyo, JP;
Shinji Kasahara, Tokyo, JP;
NEC CORPORATION, Minato-ku, Tokyo, JP;
Abstract
A slope monitoring system includes an analysis formula variable measuring meanswhich measures values of respective analysis formula variables that are obtained when a state of a test layer has been changed from a test environment in which there exist at least an arbitrary test layer or a test layer identical to a material layer forming a monitoring target slope, and a value of a predetermined first observable amount, and an analysis formula variable modeling meanswhich constructs, based on various values obtained from the test environment, for each of the analysis formula variables, a model defined a relationship of them with a second observable amount that is a predetermined observable amount being the same as the first observable amount, or having a known relationship with the first observable amount, or a predetermined third variable that can be calculated from the second observable amount.