The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2020

Filed:

Mar. 19, 2018
Applicant:

Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.o.c, Taoyuan, TW;

Inventors:

Chia-Hao Chang, Taoyuan, TW;

Shu-Chun Chang, Taoyuan, TW;

Fan-Pin Tseng, Taoyuan, TW;

Yu-Ching Ni, Taoyuan, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); G01V 5/00 (2006.01); H04N 5/357 (2011.01); G01N 23/087 (2018.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/03 (2013.01); A61B 6/4241 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5235 (2013.01); G01V 5/005 (2013.01); G01V 5/0041 (2013.01); G06T 11/005 (2013.01); A61B 6/585 (2013.01); G01N 23/087 (2013.01); G01N 2223/206 (2013.01); G01N 2223/419 (2013.01); G01N 2223/423 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/408 (2013.01); H04N 5/357 (2013.01);
Abstract

A tomography method includes: a step of having a photon counting detector to undergo a relative motion with respect to an X-Ray source, and capturing 2×N projected energy spectral data at 2×N individual discrete projection angles that divide the relative motion, the N being a positive integer; a step of reforming the 2×N projected energy spectral data at the 2×N individual discrete projection angles and establishing corresponding projection intensity data; and, a step of basing on the projection intensity data and the 2×N projected energy spectral data at the 2×N individual discrete projection angles to calculate the material decomposition images. In addition, a tomography system is also provided.


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