The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Oct. 14, 2016
Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v., Munich, DE;
Christian Muenzenmayer, Hagenbuechach, DE;
Alexander Gryanik, Erlangen, DE;
Tobias Bergen, Erlangen, DE;
Thomas Wittenberg, Erlangen, DE;
Abstract
Embodiments of the present invention relate to a method for generating a microscopy representation of a three-dimensional sample having a lateral extension in the x and y directions. The method has the following steps: a) arranging the flat three-dimensional sample on a positioner; b) recording the sample by means of an imaging device to obtain a first microscopy picture of the sample having a first section; c) altering the perspective onto the two-dimensional sample in the z direction; d) recording the sample by means of the imaging device to obtain a second microscopy picture of the sample having a second section; e) determining change information which allows drawing conclusions as to the change in perspective in the z direction, using a difference between the first and second microscopy pictures; and f) merging the first and second microscopy pictures while considering the change information to obtain the microscopy panoramic representation.