The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Oct. 21, 2016
Applicant:

Intelligent Platforms, Llc, Charlottesville, VA (US);

Inventor:

Mohan Marutirao Dhanawade, Hyderabad, IN;

Assignee:

INTELLIGENT PLATFORMS, LLC, Charlottesville, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 29/08 (2006.01); H04L 12/00 (2006.01); H04L 12/40 (2006.01); H04L 12/66 (2006.01);
U.S. Cl.
CPC ...
H04L 69/08 (2013.01); H04L 12/00 (2013.01); H04L 12/40169 (2013.01); H04L 67/12 (2013.01); H04L 69/18 (2013.01); H04L 12/66 (2013.01); H04L 2012/4026 (2013.01);
Abstract

An industrial control system and a method of controlling an industrial control system having two communications protocols is described. The method comprises sending, by a controller, communications over a first communications network to a first device, the communications intended to control the first device and a second device, the communications transmitted to the first device from the controller in a first communications protocol; translating, by the first device, the communications from the controller in the first communications protocol intended for the second device into a second communications protocol; and transmitting, by the first device, the translated communications to the second device over a second communications network using the second communications protocol, wherein the first device is used to control or monitor one or more first processes in an industrial system and the second device is used to control or monitor one or more second processes in the industrial system.


Find Patent Forward Citations

Loading…