The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Oct. 25, 2017
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Wei Cheng, Plainsboro, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Guofei Jiang, Princeton, NJ (US);
Assignee:
NEC Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 12/24 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0631 (2013.01); H04L 41/064 (2013.01); H04L 41/065 (2013.01); H04L 41/0672 (2013.01); H04L 41/16 (2013.01); H04L 43/06 (2013.01); H04L 43/0817 (2013.01); H04L 43/0823 (2013.01); H04L 43/106 (2013.01); H04L 41/069 (2013.01); H04L 43/16 (2013.01);
Abstract
Methods and systems for detecting a system fault include determining a network of broken correlations for a current timestamp, relative to a predicted set of correlations, based on a current set of sensor data. The network of broken correlations for the current timestamp is compared to networks of broken correlations for previous timestamps to determine a fault propagation pattern. It is determined whether a fault has occurred based on the fault propagation pattern. A system management action is performed if a fault has occurred.