The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Mar. 09, 2017
Applicant:

Sma Solar Technology Ag, Niestetal, DE;

Inventor:

Christopher Merz, Kassel, DE;

Assignee:

SMA Solar Technology AG, Niestetal, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H02S 50/10 (2014.01); H01L 31/02 (2006.01); H02H 7/20 (2006.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); G01R 31/025 (2013.01); H01L 31/02021 (2013.01); H02H 1/0015 (2013.01); H02H 1/0023 (2013.01); H02H 7/20 (2013.01); Y02E 10/56 (2013.01);
Abstract

A method and associated device for detecting arcs in a photovoltaic system with an inverter and with a plurality of current collector circuits connected in parallel with the inverter via collector lines, wherein a plurality of strings of photovoltaic modules are connected in parallel with each current collector circuit via string lines. The method includes acquiring measured values of electrical variables and analyzing the measured values of the electrical variables for the presence of signs of an arc in the photovoltaic system using an analysis circuit and generating an arc signal which indicates the presence of an arc if the analyzed measured values meet predefined criteria. The method also includes acquiring measured values of acoustic variables using one or more acoustic sensors, and analyzing the measured values of the acoustic variables for the presence of signs of an arc in the photovoltaic system using the analysis circuit.


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