The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Jan. 19, 2017
Applicant:

Denso Corporation, Kariya, Aichi-pref., JP;

Inventors:

Yuichi Takeuchi, Kariya, JP;

Atsuya Akiba, Kariya, JP;

Katsumi Suzuki, Nagakute, JP;

Yusuke Yamashita, Nagakute, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01); H01L 29/78 (2006.01); H01L 29/872 (2006.01); H01L 21/265 (2006.01); H01L 29/66 (2006.01); H01L 21/04 (2006.01); H01L 29/10 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 29/063 (2013.01); H01L 21/0243 (2013.01); H01L 21/0262 (2013.01); H01L 21/02378 (2013.01); H01L 21/02447 (2013.01); H01L 21/02494 (2013.01); H01L 21/02516 (2013.01); H01L 21/02529 (2013.01); H01L 21/02573 (2013.01); H01L 21/02639 (2013.01); H01L 21/046 (2013.01); H01L 21/049 (2013.01); H01L 21/0475 (2013.01); H01L 21/265 (2013.01); H01L 29/0619 (2013.01); H01L 29/1095 (2013.01); H01L 29/1608 (2013.01); H01L 29/6606 (2013.01); H01L 29/66068 (2013.01); H01L 29/78 (2013.01); H01L 29/7813 (2013.01); H01L 29/872 (2013.01); H01L 29/2003 (2013.01);
Abstract

A method for manufacturing a compound semiconductor device includes: providing a semiconductor substrate that includes a foundation layer; forming a deep trench in the foundation layer; and filling the deep trench with a deep layer having a second conductive type and a limiting layer having the first conductive type. In the filling the deep trench, growth of the deep layer from a bottom of the deep trench toward an opening inlet of the deep trench and growth of the limiting layer from a side face of the deep trench are achieved by: dominant epitaxial growth of a second conductive type layer over a first conductive type layer on the bottom of the deep trench; and dominant epitaxial growth of the first conductive type layer over the second conductive type layer on the side face of the deep trench, based on plane orientation dependency of the compound semiconductor during epitaxial growth.


Find Patent Forward Citations

Loading…