The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Mar. 05, 2019
Midea Group Co., Ltd., Foshan, CN;
MIDEA GROUP CO., LTD., Foshan, CN;
Abstract
A method of quality inspection is performed by a robotic arm that includes a plurality of segments, a camera at an end of the robotic arm, and a plurality of joints connecting two segments of the plurality of segments. The method includes (i) inspecting, via the camera, a surface of a product with the camera positioned at a first position, (ii) based on the inspecting, identifying: (a) an area of interest on the surface of the product, and (b) a relative location of the area of interest on the surface, (iii) positioning, based on the relative location of the area of interest on the surface, the camera at a second position, and (iv) inspecting, via the camera, the area of interest on the surface of the product with the camera positioned at the second position. Inspecting the area of interest includes inspecting a subset of the surface of the product.