The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Sep. 16, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Zhuang Wang, Wyncote, PA (US);

Fabian Moerchen, Bainbridge Island, NJ (US);

Dmitriy Fradkin, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01); G06F 11/00 (2006.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 11/008 (2013.01); G06N 7/00 (2013.01); G06N 20/00 (2019.01); G16H 40/40 (2018.01);
Abstract

A method of building a model for predicting failure of a machine, including parsing () daily machine event logs of one or more machines to extract data for a plurality of features, parsing () service notifications for the one or more machine to extract failure information data, creating () bags from the daily machine event log data and failure information data for multiple instance learning by grouping daily event log data into the bags based on a predetermined predictive interval, labeling each bag with a with a known failure as positive, and bags without known failures as negative, where a bag is a set of feature vectors and an associated label, where each feature vector is an n-tuple of features, transforming () the multiple instance learning bags into a standard classification task form, selecting () a subset of features from the plurality of features, and training () a failure prediction model using the selected subset of features.


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