The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Mar. 09, 2018
Applicant:

The United States of America, As Represented BY the Secretary of the Navy, Crane, IN (US);

Inventors:

Tyler Fitzsimmons, Bloomington, IN (US);

Betsy Marschand, Bloomington, IN (US);

Clay Armstrong, Jasper, IN (US);

Joshua Borneman, Bloomington, IN (US);

Aaron Cole, Bloomington, IN (US);

Lauren Christopher, Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01); H04N 7/18 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01); G06K 9/00718 (2013.01); G06K 9/6253 (2013.01); H04N 7/181 (2013.01); G01J 1/4257 (2013.01);
Abstract

Various embodiments can include artificial learning counter surveillance (ALCS) or self-protection surveillance systems (SPSS) and related methods. Apparatuses and methods can include non-destructive electro-optic interference or protection systems as well non-destructive directed energy systems, a control system, and an analysis system for determining an optical system of interest and generating degradation or disruption effects using various equipment items and machine learning systems. Additionally, methods are also provided for determining degree of severity of degradation or disruption based on threshold definitions related to ability to use the optical system of interest for one or more specified applications.


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