The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Nov. 16, 2015
Applicant:
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Inventors:
Gerd Bresser, Munich, DE;
Luke Cirillo, Poing, DE;
Assignee:
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01R 23/165 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00 (2013.01); G01R 23/165 (2013.01);
Abstract
The invention is related to a method and a measurement device for performing multidimensional signal analysis. The measurement device comprises at least one input terminal configured to apply a signal for a signal analysis. A displaying unit is configured to display the applied signal. A masking unit is configured to define a signal mask, wherein at least one signal mask parameter of the signal mask dynamically varies over the signal analysis time of the applied signal.