The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Sep. 14, 2018
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Mehmet Kivanc Ozonat, San Jose, CA (US);

Ablimit Aji, San Jose, CA (US);

Mehmet Oguz Sayal, Sunnyvale, CA (US);

Natalia Vasileva, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G01R 31/3183 (2006.01); G06F 17/50 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G01R 31/3183 (2013.01); G06F 11/263 (2013.01); G01R 31/31917 (2013.01); G06F 2217/16 (2013.01);
Abstract

Systems and methods are provided for performing a fast simulation using test parameter vectors as inputs. The method includes retrieving precomputed samples from a sample repository stored in a non-volatile memory, the precomputed samples being precomputed using a simulated model, predetermined parameter vectors, and random inputs; storing respective subsets of the precomputed samples in local memories of a plurality of respective hardware processors; storing the test parameter vectors in the local memories of the hardware processors; at each of the hardware processors, selecting a subset of the precomputed samples stored in the local memory of the hardware processor based on the test parameter vectors, computing test samples by executing the simulated model using the test parameter vectors and the random inputs; and combining the subset of the precomputed samples and the test samples to produce a simulation result.


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