The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Nov. 22, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Raghavendra R. Dhayapule, Bangalore, IN;

Ritesh K. Gupta, Hyderabad, IN;

Sumit Kumar, Bangalore, IN;

Rajesh Phillips, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01);
Abstract

A method for testing an extract, transform, load job (ETL job) is provided. The method may include receiving an uploaded ETL job. The method may also include executing a functionality test of the uploaded ETL job using a test bucket. The method may further include determining the executed functionality test produces a failure result. The method may also include creating at least one test sub-job corresponding to at least one stage within on the uploaded ETL job. The method may further include generating a plurality of test data for each of the at least one created test sub-job. The method may also include executing the at least one created test sub-job using the plurality of generated test data. The method may further include creating a report based on a plurality of results associated with the at least one executed test sub-job.


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