The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

May. 25, 2018
Applicant:

Microsoft Technology Licensing, Llc., Redmond, WA (US);

Inventors:

Jorge Banuelos, Kirkland, WA (US);

Xi Cheng, Kirkland, WA (US);

Neelakantan Sundaresan, Bellevue, WA (US);

Cenzhuo Yao, Bellevue, WA (US);

Kexin Xu, Bellevue, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3668 (2013.01); G06F 11/368 (2013.01); G06F 11/3664 (2013.01); G06N 20/00 (2019.01);
Abstract

Machine learning techniques are used to determine the viability of user data measuring the behavior of a new version of the program when compared with user data that measured the behavior of a previous version of the program. The machine learning techniques utilize statistical techniques in a non-conventional manner to train a system to learn from data obtained from the usage of both a new version of the program and a previous version that accounts for the variability in the user population, time variability of the results of the previous version, and feature coverage between the two test results in order to ensure the suitability of the user data in making estimations or predictions about the performance and reliability of the new version.


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