The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Jun. 21, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Colin Yong Zou, Beijing, CN;

Xiangqing Yang, Shanghai, CN;

Man Lv, Beijing, CN;

Wei Lin, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/48 (2006.01); G06F 9/50 (2006.01); G06F 3/06 (2006.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 9/4843 (2013.01); G06F 3/061 (2013.01); G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 9/45558 (2013.01); G06F 9/5027 (2013.01); G06F 9/5077 (2013.01); G06F 2009/45562 (2013.01); G06F 2009/45579 (2013.01); G06F 2009/45583 (2013.01);
Abstract

Embodiments of the present disclosure provide a method of analyzing data in a storage system, a storage system, and a computer program product. The method includes: in response to detecting a request for a data analytic job, obtaining target data for the data analytic job from a first storage device of the storage system. The method also includes storing the target data into a second storage device of the storage system that is assigned for data analysis, and performing the data analytic job using a data processing device and the second storage device in the storage system.


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