The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Aug. 14, 2017
Applicant:

Hoya Corporation, Shinjuku-ku, JP;

Inventors:

Yohei Ikebe, Shinjuku-ku, JP;

Masaru Tanabe, Shinjuku-ku, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/60 (2012.01); G03F 1/22 (2012.01); G03F 1/24 (2012.01); H01L 21/033 (2006.01); C03C 17/36 (2006.01); G03F 7/20 (2006.01); G03F 1/66 (2012.01);
U.S. Cl.
CPC ...
G03F 1/60 (2013.01); C03C 17/36 (2013.01); C03C 17/3602 (2013.01); C03C 17/3636 (2013.01); C03C 17/3649 (2013.01); C03C 17/3657 (2013.01); G03F 1/22 (2013.01); G03F 1/24 (2013.01); H01L 21/0332 (2013.01); H01L 21/0335 (2013.01); H01L 21/0337 (2013.01); H01L 21/0338 (2013.01); C03C 2217/254 (2013.01); C03C 2217/26 (2013.01); C03C 2217/28 (2013.01); C03C 2217/734 (2013.01); C03C 2218/156 (2013.01);
Abstract

The object is to provide a mask blank substrate, a mask blank, and a transfer mask which can achieve easy correction of a wavefront by a wavefront correction function of an exposure apparatus. The further object is to provide methods for manufacturing them. A virtual surface shape, which is an optically effective flat reference surface shape defined by a Zernike polynomial, is determined, wherein the Zernike polynomial is composed of only terms in which the order of variables related to a radius is second or lower order and includes one or more terms in which the order of the variables related to a radius is second-order; and the mask blank substrate, in which difference data (PV value) between the maximum value and the minimum value of difference shape between a virtual surface shape and a composite surface shape obtained by composing respective surface shapes of two main surfaces is 25 nm or less, is selected.


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