The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Sep. 30, 2017
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;

Inventors:

Xinyou Ji, Beijing, CN;

Yanqiang Wang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1362 (2006.01); G06F 3/041 (2006.01); G02F 1/1345 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136286 (2013.01); G06F 3/0416 (2013.01); G02F 1/1345 (2013.01); G02F 2001/13629 (2013.01); G06F 2203/04103 (2013.01);
Abstract

An array substrate includes a base substrate and at least three layers of signal lines insulated from each other and arranged in a non-display region. The signal lines include first signal lines in a first layer and second signal lines in a second layer extending in an identical direction, and third signal lines in a third layer crossing the first and the second signal lines. A distance between each third signal line and the base substrate is larger than a distance between each first/second signal line and the base substrate. An orthogonal projection of each first signal line on the base substrate overlaps that of the corresponding third signal line to form a first overlapping region, an orthogonal projection of each second signal line overlaps that of the corresponding third signal line to form a second overlapping region which partially overlaps, or does not overlap, the first overlapping region.


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