The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Apr. 20, 2018
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Ryuji Saneto, Kanagawa, JP;

Yuuichi Fukushige, Kanagawa, JP;

Masato Nagura, Kanagawa, JP;

Hitoshi Namikawa, Kanagawa, JP;

Takashi Tamada, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01); G02B 5/30 (2006.01); G02F 1/35 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133602 (2013.01); G02F 1/133504 (2013.01); G02F 1/133528 (2013.01); G02F 1/133606 (2013.01); G02B 5/3033 (2013.01); G02F 2001/133567 (2013.01); G02F 2001/3505 (2013.01); G02F 2201/50 (2013.01);
Abstract

A liquid crystal display device has a liquid crystal panel including a liquid crystal cell and a polarizing plate; and a backlight unit including a light source. An outermost surface of the liquid crystal panel on the backlight unit side is a surface of a protective film included in the polarizing plate, an outermost surface of the backlight unit on the liquid crystal panel side is a surface of a diffusion member, and where an arithmetic mean roughness measured on an outermost surface of the liquid crystal panel on the backlight unit side is Ra1, a pencil hardness is P1, an arithmetic mean roughness measured on an outermost surface of the backlight unit on the liquid crystal panel side is Ra2, and a pencil hardness is P2, Expression 1: 33 nm<Ra1<135 nm, Expression 2: Ra2<15 nm, and Expression 3: P1<P2 are satisfied.


Find Patent Forward Citations

Loading…