The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Aug. 15, 2014
Applicants:

International Business Machines Corporation, Armonk, NY (US);

Shell Oil Company, Houston, TX (US);

Inventors:

Andrew R. Conn, Mount Vernon, NY (US);

Sippe Douma, Sultanate of Oman, NL;

Gijs Van Essen, Sultanate of Oman, NL;

Lior Horesh, Ossining, NY (US);

Eduardo Antonio Arismendi Jimenez, Houston, TX (US);

Ulisses Mello, Blauvelt, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 99/00 (2009.01); E21B 43/16 (2006.01); G01V 1/30 (2006.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); E21B 43/16 (2013.01); G01V 1/306 (2013.01); G01V 11/00 (2013.01); G01V 2210/66 (2013.01);
Abstract

A method, system and computer program product for integrating plural modalities of information to obtain values for a specified attribute of a given system. In one embodiment, data of a first modality, conveying a first source of data of a first type of the system is acquired; a simulator is configured with settings of physical sensors; and data of a second modality from the system, conveying a second source of data of a second type of the system is acquired. The data of the second modality is converted to data of the first type, while configuring a virtual set of sensors to enable acquisition of the converted data of the second modality; and an adjoints equipped simulator is configured with settings of the virtual sensors, to mimic collection of data of the first type, while configured to measure data of the second type.


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