The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Dec. 12, 2016
Applicant:

Ion Geophysical Corporation, Houston, TX (US);

Inventors:

Chao Wang, Houston, TX (US);

Howard David Yingst, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/06 (2006.01); G01V 1/28 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); G01V 1/36 (2013.01); G01V 2210/614 (2013.01); G01V 2210/6222 (2013.01); G01V 2210/675 (2013.01); G01V 2210/679 (2013.01);
Abstract

Computer systems and methods are provided for seismic wavefield processing, including time domain reconstructed full wavefield inversion (TDRFWI) of seismic survey data. Suitable methods include forward propagating a source signal based on a model of a subsurface region, generating a residual based on the forward-propagated wavefield in comparison to field data, back propagating the residual to generate a reconstructed source perturbation, and adding the reconstructed source perturbation to the source signal to generate a reconstructed source wavefield. The reconstructed source perturbation can be forward propagated to generate a reconstructed wavefield perturbation, and added to the reconstructed wavefield perturbation to reconstruct the wavefield. The propagations can be performed in the time domain, and the model can be updated based on the reconstructed wavefield and reconstructed source perturbation to generate high fidelity subsurface images.


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