The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Feb. 10, 2016
Applicant:

National University Corporation Hokkaido University, Sapporo-shi, Hokkaido, JP;

Inventors:

Masayori Ishikawa, Sapporo, JP;

Ryo Ogawara, Sapporo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01T 1/17 (2006.01); C01F 17/00 (2020.01); C09K 11/77 (2006.01); C09K 11/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/20 (2013.01); C01F 17/0056 (2013.01); C09K 11/7704 (2013.01); G01T 1/17 (2013.01); C09K 11/00 (2013.01);
Abstract

The present invention identifies α decay and other events included in the emission of an LaBrscintillator and only collects γ ray events. An LaBrscintillation detector is provided with an LaBr3 scintillator, a photomultiplier tube, an oscilloscope, and a computer. The computerdetects a peak value Vp and a total charge amount Qof a voltage waveform signal and calculates an error propagation expression function for a ratio of the peak value Vp to the total charge amount Q. This error propagation expression function is used as a threshold function for identifying and removing α decay events. The α decay events are identified from the peak value Vp and total charge amount Q, which are measurement values that can be measured in real time.


Find Patent Forward Citations

Loading…