The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Dec. 04, 2018
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Sunder Nochilur Ranganathan, Karnataka, IN;

Mahesh Venkataraman, Bangalore, IN;

Kulkarni Girish, Bangalore, IN;

Mallika Fernandes, Bangalore, IN;

Jothi Gouthaman, Chennai, IN;

Venugopal S. Shenoy, Bangalore, IN;

Kishore P. Durg, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G01R 31/3183 (2006.01); G06F 11/36 (2006.01); G06N 20/00 (2019.01); G06F 15/76 (2006.01); G06F 16/901 (2019.01); G06F 8/10 (2018.01); G06N 5/02 (2006.01); G06F 11/00 (2006.01); G06F 11/34 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31835 (2013.01); G06F 8/10 (2013.01); G06F 11/008 (2013.01); G06F 11/3438 (2013.01); G06F 11/3476 (2013.01); G06F 11/3616 (2013.01); G06F 11/3664 (2013.01); G06F 11/3676 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 11/3696 (2013.01); G06F 15/76 (2013.01); G06F 16/9024 (2019.01); G06N 5/02 (2013.01); G06N 20/00 (2019.01); G05B 23/0229 (2013.01); G06F 2201/865 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for a touchless testing platform employed to, for example, create automated testing scripts, sequence test cases, and implement defect solutions. In one aspect, a method includes receiving a log file and testing results generated from a code base for an application; processing the log file through a pattern-mining algorithm to determine a usage pattern of code modules within the code base; clustering defects from the testing results based on a respective functionality of the application reported within each of the defects; generating testing prioritizations for test cases for the application by assigning weightages to the test cases based on the clusters of defects and the usage pattern of the code modules within the code base; sequencing a set of the test cases based on the test prioritizations; and transmitting the sequence to a test execution engine.


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