The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
May. 31, 2018
Nicolas Badeau, Quebec, CA;
Guillaume Painchaud-april, Quebec, CA;
Benoit Lepage, L'Ancienne-Lorette, CA;
Nicolas Badeau, Quebec, CA;
Guillaume Painchaud-April, Quebec, CA;
Benoit Lepage, L'Ancienne-Lorette, CA;
Olympus Scientific Solutions Americas Inc., Waltham, MA (US);
Abstract
Disclosed is a system and method of determining the test surface profile and compensating the gain amplitude when using time reversal focal laws in ultrasound non-destructive testing. Computer simulations are used to compute the diffraction field at time of incidence of the transmitted parallel wave front on the test surface. Knowledge of the surface profile and the diffraction field allows determination of coverage at the test surface and improved accuracy of flaw sizing.