The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Oct. 04, 2017
Applicant:

Dainichi Machine and Engineering Co., Ltd., Yokohama-shi, JP;

Inventors:

Kazuma Takakura, Yokohama, JP;

Gijun Idei, Yokohama, JP;

Masao Kaizuka, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9086 (2013.01); G01N 27/9033 (2013.01);
Abstract

A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.


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