The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Nov. 07, 2016
Applicant:

Battelle Energy Alliance, Llc, Idaho Falls, ID (US);

Inventors:

David H. Hurley, Idaho Falls, ID (US);

Robert S. Schley, Rigby, ID (US);

Marat Khafizov, Columbus, OH (US);

Assignee:

Battelle Energy Alliance, LLC, Idaho Falls, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01);
Abstract

A method of determining a thermal conductivity and a thermal diffusivity of a material comprises exposing a specimen comprising a substrate of a material and a metallic film over the substrate to an amplitude modulated pump laser beam comprising electromagnetic radiation having a first wavelength and a first modulation frequency to form a pump spot on the metallic film. The specimen is exposed to a probe laser beam comprising electromagnetic radiation having a second wavelength to form a probe spot on the metallic film. A phase shift between the pump laser beam and a reflected probe laser beam is measured while scanning the pump spot relative to the probe spot. A modulation frequency of the pump laser beam is changed to a second modulation frequency and the pump spot is scanned relative to the probe spot while detecting the phase shift. A phase profile of the material is measured and a continuum-based model is fit to the phase profile. Related microscopes and related methods are also disclosed.


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