The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Dec. 20, 2018
Fundacion Tecnalia Research & Innovation, Donostia-San Sebastián, ES;
Universidad Del País Vasco-euskal Herriko Unibertsitatea, Leioa, ES;
Estibaliz Garrote Contreras, Derio, ES;
Alberto Isasi Andrieu, Derio, ES;
Gorka Duro Rodriguez, Derio, ES;
Pedro María Iriondo Bengoa, Leioa, ES;
FUNDACION TECNALIA RESEARCH & INNOVATION, Donostia-San Sebastian, ES;
UNIVERSIDAD DEL PAIS VASCO-EUSKAL HERRIKO UNIBERTSITATEA, Leioa, ES;
Abstract
Systems for visually inspecting a surface of an object are provided, which includes a visual inspection head, and a positioning apparatus for controlling a position and/or an orientation of the visual inspection head with respect to the object. The visual inspection head includes a visual inspection module, and an angle controlling module for ensuring a predetermined angle of the visual inspection system with respect to an area to be inspected of the surface of the object. The angle controlling module may include a pointer for projecting a light beam onto the area to be inspected and a camera for determining whether the light beam is reflected substantially perpendicularly. The system is configured to move the visual inspection head relative to the object until the light beam is reflected substantially perpendicularly. Methods for visually inspecting a surface are also provided.