The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Aug. 15, 2017
Konica Minolta, Inc., Chiyoda-ku, JP;
Toshio Kawano, Sakai, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
A multi-angle optical characteristic measuring device and an optical unit therefor include: an illuminating portion that irradiates a measurement point with an illuminating light beam; a plurality of reflecting mirrors that are arranged facing the measurement point at a plurality of different observation angles, and modify traveling directions of measurement light beams emitted from the measurement point in response to the illuminating light beam; one light receiving optical system that receives the measurement light beams from the plurality of reflecting mirrors; and a two-dimensional detecting portion that detects the measurement light beams received by the light receiving optical system, and the plurality of reflecting mirrors modifies the traveling directions of the measurement light beams such that the two-dimensional detecting portion detects the measurement light beams at different positions on the two-dimensional detecting portion.