The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Apr. 02, 2018
Fluke Corporation, Everett, WA (US);
J. David Schell, Austin, TX (US);
Richard G. Tyler, Campton, NH (US);
Fluke Corporation, Everett, WA (US);
Abstract
One or more embodiments are directed to optical test instruments, such as fiber optic inspection scopes and optical power meters, for testing optical communication links, such as fiber optic connectors. The optical test instruments include a single test port that is able to operate in two modes of operation. In a first mode of operation, the optical test instrument is configured to provide an image of the endface of a fiber optic connector under test. In a second mode of operation, the optical test instrument is configured to measure power or power loss in an optical fiber under test. In that regard, the fiber optic connector only has to be coupled to a single port of an optical test instrument for a visual inspection of an endface of a fiber optic connector and a power test of the optical fiber under test.