The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Apr. 09, 2017
Pixart Imaging Inc., Hsin-Chu, TW;
Yu-Han Chen, Hsin-Chu, TW;
Chih-Wei Huang, Hsin-Chu, TW;
Chi-Chieh Liao, Hsin-Chu, TW;
Wei-Chung Wang, Hsin-Chu, TW;
PixArt Imaging Inc., Hsin-Chu, TW;
Abstract
A pressure measuring method, applied to a pressure measuring apparatus, comprising: measuring a first pressure sensing value of the pressure measuring apparatus, which corresponds to a first pressure in a test mode; measuring a second pressure sensing value of the pressure measuring apparatus, which corresponds to a second pressure in the test mode; generating a first corresponding function according to the first pressure, the second pressure, the first pressure sensing value and the second pressure sensing value; sensing a third pressure sensing value via the pressure measuring apparatus in a normal mode; and generating a third pressure according to the third pressure sensing value via the first corresponding function; wherein the pressure measuring apparatus operates at a first scan frequency. By this way, the pressure sensing value can be calibrated, to solve the issue that the pressure sensing values are affected by scan frequencies.