The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Feb. 09, 2018
Applicant:

Lockheed Martin Coherent Technologies, Inc., Louisville, CO (US);

Inventors:

Bruce Gregory Tiemann, Longmont, CO (US);

Paul Johan Mikael Suni, Berthoud, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/02 (2006.01); G01J 3/45 (2006.01); G01J 3/453 (2006.01);
U.S. Cl.
CPC ...
G01J 9/0246 (2013.01); G01J 3/45 (2013.01); G01J 3/4532 (2013.01); G01J 9/02 (2013.01); G01J 2009/0288 (2013.01);
Abstract

An apparatus includes a photonic integrated circuit (PIC) to measure an optical wavelength of a light source. The PIC includes an optical splitter, a plurality of tunable interferometers and one or more detectors. The optical splitter is coupled to the light source, and the interferometers are coupled to the optical splitter. Each interferometer receives a portion of an optical signal of the light source. One or more detectors are coupled to each interferometer, and the interferometers have different free spectral ranges (FSRs). A largest FSR value of the different FSRs is greater than an entire intended wavelength measurement range of the PIC.


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