The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Sep. 28, 2018
Samsung Electronics Co., Ltd., Suwon-si, KR;
California Institute of Technology, Pasadena, CA (US);
Duhyun Lee, Yongin-si, KR;
Andrei Faraon, Pasadena, CA (US);
Ehsan Arbabi, Pasadena, CA (US);
Sadegh Faraji-Dana, Pasadena, CA (US);
Mahsa Seyedeh Kamali, Pasadena, CA (US);
Yu Horie, Pasadena, CA (US);
Chanwook Baik, Yongin-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Abstract
A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.