The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Jan. 10, 2019
Applicant:

The Trustees of Princeton University, Princeton, NJ (US);

Inventors:

Richard Miles, Princeton, NJ (US);

Arthur Dogariu, Hamilton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/10 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4412 (2013.01); G01J 3/10 (2013.01); G01J 3/2823 (2013.01);
Abstract

Disclosed is a process and device that enables ultra-high resolution one- and two-dimensional spatial imaging of Rayleigh, Raman and Thomson spectral features without the need for a spectrometer. The disclosed approach provides the capability for imaging of a single spectral feature such as a single rotational Raman line and the simultaneous elimination of background scattering, or for separating the rotational Raman image from the Rayleigh scattering. High collection efficiency provides the opportunity for single pulse time frozen images to be acquired.


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