The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Oct. 04, 2016
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventor:

Taichi Yuasa, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01J 3/02 (2006.01); G02B 27/00 (2006.01); G02B 5/10 (2006.01); G02B 13/18 (2006.01); G01J 3/10 (2006.01); G01J 3/42 (2006.01); G01N 21/27 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0208 (2013.01); G01J 3/108 (2013.01); G01J 3/42 (2013.01); G01N 21/27 (2013.01); G02B 5/10 (2013.01); G02B 13/18 (2013.01); G02B 27/0025 (2013.01); G01N 33/383 (2013.01); G01N 2201/061 (2013.01); G01N 2201/0638 (2013.01);
Abstract

The invention provides a spectroscopic instrument, which comprises a projecting optical system for projecting a projecting light emitted from a light source, a photodetecting optical system for receiving a reflection light from an object to be measured and for guiding to a photodetection member, and a spectroscope for detecting a condition of the object to be measured based on the reflection light as received by the photodetection member, wherein the projecting optical system and the photodetecting optical system have a projecting system chromatic aberration decreasing component and a photodetecting system chromatic aberration decreasing component which eliminate chromatic aberrations, respectively.


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