The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2020
Filed:
Jun. 20, 2017
Ixblue, Saint-Germain-en-Laye, FR;
Eric Ducloux, Rueil Malmaison, FR;
IXBLUE, Saint-Germain-en-Laye, FR;
Abstract
Disclosed is a system for the interferometric measurement of a physical parameter, including an amplified spontaneous emission light source, optically connected to a Sagnac ring interferometer, and two detectors, each supplying a measurement signal representative of the light output from the interferometer, and a reference signal representative of the light output emitted by the source, which is impaired by an excess relative intensity noise. This measurement is obtained from a difference between the measurement and reference signals, weighted by a weighting coefficient which is controlled to minimise the statistical deviation of an additional weighted difference between signals obtained by demodulating the measurement and reference signals by way of an additional digital demodulation sequential code insensitive to the parameter. Also disclosed is a gyroscope including such a measuring system.