The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Nov. 18, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Roland Proksa, Neu Wulmstorf, DE;
Rolf Karl Otto Behling, Norderstedt, DE;
Carolina Ribbing, Aachen, DE;
Lester Donald Miller, Hudson, OH (US);
Alexander Eitel, Hamburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a device () and a method () for determining a status of an X-ray tube () of an X-ray system (). Due to ageing and/or wear of the X-ray tube, the spectrum of the X-ray radiation () provided by the X-ray tube may change over the operation time of the X-ray tube. The present invention therefore suggests evaluating spectrally different values detected with an X-ray detector arrangement () of the X-ray system. A reference data set representing a reference condition of the X-ray tube by a plurality of spectrally different reference-values () and a working data set representing an aged condition of the X-ray tube by a plurality of spectrally different working-values () of detected X-ray radiation are used to determine an equivalent filtration function for an filtration material influencing a source X-ray radiation () emitted by an anode () of the X-ray tube. Accordingly, the filtration function provides the information about the material being used for the filtration and/or its length, which may provide the basis to determine the condition and thus the status of the X-ray tube.